Materials Characterisation G

Course aim

This course aims to comprehensively prepare the student for further studies in state of the art material characterization techniques for analyzing the composition and properties of advanced materials.

Course content

• x-ray photoelectron spectrometry.
• time-of-fligh-secondary-ion-mass-spectrometry. 
• atomic force microscopy.
• electron microscopy with microanalysis 
• thermo-gravimetry. 
• x-ray diffraction
• mechanical testing.

Textbook(s)

Nil

Prerequisite(s)

Nil

Corequisite(s)

Nil

Teaching method

Note: These components may or may not be scheduled in every study period. Please refer to the timetable for further details.

Assessment

Assignment, Presentation

Fees

EFTSL*: 0.125
Commonwealth Supported program (Band 2)
To determine the fee for this course as part of a Commonwealth Supported program, go to:
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Fee-paying program for domestic and international students
International students and students undertaking this course as part of a postgraduate fee paying program must refer to the relevant program home page to determine the cost for undertaking this course.

Non-award enrolment
Non-award tuition fees are set by the university. To determine the cost of this course, go to:
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Not all courses are available on all of the above bases, and students must check to ensure that they are permitted to enrol in a particular course.

* Equivalent Full Time Study Load. Please note: all EFTSL values are published and calculated at ten decimal places. Values are displayed to three decimal places for ease of interpretation.